{"product_id":"materials-characterization-techniques-9781420042948","title":"Materials Characterization Techniques","description":"\u003cp\u003eWith an emphasis on practical applications and real-world case studies, this volume presents the principles of widely used advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. The book reviews the most popular and powerful analysis and quality control tools, explaining the appropriate uses and related technical requirements. The text features coverage of a wide range of topics, including Auger electron spectroscopy, atomic force microscopy, transmission electron microscopy, gel electrophoresis chromatography, laser confocal scanning florescent microscopy, and UV spectroscopy. It presents the fundamentals of vacuum as well as X-ray diffraction principles.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Sam Zhang,Lin Li,Ashok Kumar\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e CRC Press\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 12\/01\/2008\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 342\u003cbr\u003e\u003cb\u003eBinding Type:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.35lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.30h x 6.20w x 0.80d\u003cbr\u003e\u003cb\u003eISBN:\u003c\/b\u003e 9781420042948\u003cbr\u003e\u003cbr\u003e\u003cb\u003eReview Citation(s): \u003c\/b\u003e\u003cbr\u003e\u003ci\u003eScitech Book News\u003c\/i\u003e 06\/01\/2009 pg. 134","brand":"CRC Press","offers":[{"title":"Hardcover","offer_id":44429855391859,"sku":"9781420042948","price":268.95,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0555\/9255\/0515\/files\/img_2aa83265-bc57-4191-b71c-a0e762ba1f94.jpg?v=1772716922","url":"https:\/\/bookstorenmore.com\/en-de\/products\/materials-characterization-techniques-9781420042948","provider":"Bookstore N More","version":"1.0","type":"link"}