{"product_id":"semiconductor-material-and-device-characterization-9780471739067","title":"Semiconductor Material and Device Characterization","description":"\u003cb\u003eThis \u003ci\u003eThird Edition\u003c\/i\u003e updates a landmark text with the latest findings\u003c\/b\u003e \u003cp\u003e\u003ci\u003eThe Third Edition\u003c\/i\u003e of the internationally lauded \u003ci\u003eSemiconductor Material and Device Characterization\u003c\/i\u003e brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the \u003ci\u003eThird Edition\u003c\/i\u003e set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques.\u003c\/p\u003e \u003cp\u003e\u003ci\u003eSemiconductor Material and Device Characterization\u003c\/i\u003e remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated \u003ci\u003eThird Edition\u003c\/i\u003e, including: \u003c\/p\u003e \u003cul\u003e \u003cli\u003eUpdated and revised figures and examples reflecting the most current data and information\u003c\/li\u003e \u003cli\u003e260 new references offering access to the latest research and discussions in specialized topics\u003c\/li\u003e \u003cli\u003eNew problems and review questions at the end of each chapter to test readers' understanding of the material\u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003eIn addition, readers will find fully updated and revised sections in each chapter.\u003c\/p\u003e \u003cp\u003ePlus, two new chapters have been added: \u003c\/p\u003e \u003cul\u003e \u003cli\u003eCharge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy.\u003c\/li\u003e \u003cli\u003eReliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.\u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003eWritten by an internationally recognized authority in the field, \u003ci\u003eSemiconductor Material and Device Characterization\u003c\/i\u003e remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials.\u003c\/p\u003e \u003cp\u003eAn Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Dieter K. Schroder\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley-IEEE Press\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 12\/01\/2005\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 800\u003cbr\u003e\u003cb\u003eBinding Type:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 2.66lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 8.78h x 5.68w x 1.60d\u003cbr\u003e\u003cb\u003eISBN:\u003c\/b\u003e 9780471739067\u003cbr\u003e\u003cp\u003e\u003cb\u003eAbout the Author\u003c\/b\u003e\u003cbr\u003e\u003cb\u003eDIETER K. SCHRODER\u003c\/b\u003e, PhD, is Professor, Department of Electrical Engineering, Arizona State University. He is a recipient of the ASU College of Engineering Teaching Excellence Award and several other teaching awards. In addition to Semiconductor Material and Device Characterization, Dr. Schroder is the author of Advanced MOS Devices.\u003cbr\u003e\u003c\/p\u003e\u003cp\u003e\u003ci\u003eThis title is not returnable\u003c\/i\u003e\u003cbr\u003e\u003c\/p\u003e","brand":"Wiley-IEEE Press","offers":[{"title":"Hardcover","offer_id":40011756011635,"sku":"9.78E+12","price":189.95,"currency_code":"EUR","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0555\/9255\/0515\/products\/img_01fce7a7-9360-4322-bc4d-d457cb0a5900.jpg?v=1650490591","url":"https:\/\/bookstorenmore.com\/en-de\/products\/semiconductor-material-and-device-characterization-9780471739067","provider":"Bookstore N More","version":"1.0","type":"link"}