{"product_id":"next-generation-halt-and-hass-robust-design-of-electronics-and-systems-9781118700235","title":"Next Generation Halt and Hass: Robust Design of Electronics and Systems","description":"\u003cb\u003eNEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS\u003c\/b\u003e \u003cp\u003e\u003cb\u003eA NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS\u003c\/b\u003e \u003c\/p\u003e\u003cp\u003e\u003ci\u003eNext Generation HALT and HASS\u003c\/i\u003e presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics of failure based robust product and process development methodology. The new methodologies challenge misleading and sometimes costly misapplication of probabilistic failure prediction methods (FPM) and provide a new deterministic map for reliability development. The authors clearly explain the new approach with a logical progression of problem statement and solutions. \u003c\/p\u003e\u003cp\u003eThe book helps engineers employ HALT and HASS by demonstrating why the misleading assumptions used for FPM are invalid. Next, the application of HALT and HASS empirical discovery methods to quickly find unreliable elements in electronics systems gives readers practical insight into the techniques. \u003c\/p\u003e\u003cp\u003eThe physics of HALT and HASS methodologies are highlighted, illustrating how they uncover and isolate software failures due to hardware-software interactions in digital systems. The use of empirical operational stress limits for the development of future tools and reliability discriminators is described. \u003c\/p\u003e\u003cp\u003eKey features: \u003c\/p\u003e\u003cul\u003e\n\u003cli\u003eProvides a clear basis for moving from statistical reliability prediction models to practical methods of insuring and improving reliability.\u003c\/li\u003e \u003cli\u003eChallenges existing failure prediction methodologies by highlighting their limitations using real field data.\u003c\/li\u003e \u003cli\u003eExplains a practical approach to why and how HALT and HASS are applied to electronics and electromechanical systems.\u003c\/li\u003e \u003cli\u003ePresents opportunities to develop reliability test discriminators for prognostics using empirical stress limits.\u003c\/li\u003e \u003cli\u003eGuides engineers and managers on the benefits of the deterministic and more efficient methods of HALT and HASS.\u003c\/li\u003e \u003cli\u003eIntegrates the empirical limit discovery methods of HALT and HASS into a physics of failure based robust product and process development process.\u003c\/li\u003e\n\u003c\/ul\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Kirk A. Gray, John J. Paschkewitz\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 05\/23\/2016\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 296\u003cbr\u003e\u003cb\u003eBinding Type:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.10lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.10h x 5.90w x 0.80d\u003cbr\u003e\u003cb\u003eISBN:\u003c\/b\u003e 9781118700235\u003cbr\u003e\u003cp\u003e\u003cb\u003eAbout the Author\u003c\/b\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003e\u003cb\u003eKirk A. Gray, \u003c\/b\u003e \u003ci\u003eAccelerated Reliability Solutions, LLC, Colorado, USA\u003c\/i\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003eJohn J. Paschkewitz, \u003c\/b\u003e \u003ci\u003eProduct Assurance Engineering, LLC, Missouri, USA\u003c\/i\u003e\u003cbr\u003e\u003c\/p\u003e","brand":"Wiley","offers":[{"title":"Hardcover","offer_id":41348759027827,"sku":"9.78112E+12","price":190.11,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0555\/9255\/0515\/products\/img_a0812d39-95f7-4c8d-b449-c369cf9f0b0e.jpg?v=1707941954","url":"https:\/\/bookstorenmore.com\/products\/next-generation-halt-and-hass-robust-design-of-electronics-and-systems-9781118700235","provider":"Bookstore N More","version":"1.0","type":"link"}