{"product_id":"semiconductor-memories-technology-testing-and-reliability-9780780310001","title":"Semiconductor Memories: Technology, Testing, and Reliability","description":"Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.\u003cbr\u003e * Memory cell structures and fabrication technologies.\u003cbr\u003e * Application-specific memories and architectures.\u003cbr\u003e * Memory design, fault modeling and test algorithms, limitations, and trade-offs.\u003cbr\u003e * Space environment, radiation hardening process and design techniques, and radiation testing.\u003cbr\u003e * Memory stacks and multichip modules for gigabyte storage.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Ashok K. Sharma\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley-IEEE Press\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 09\/10\/2002\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 480\u003cbr\u003e\u003cb\u003eBinding Type:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 2.34lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 10.27h x 7.29w x 1.17d\u003cbr\u003e\u003cb\u003eISBN:\u003c\/b\u003e 9780780310001\u003cbr\u003e\u003cp\u003e\u003cb\u003eAbout the Author\u003c\/b\u003e\u003cbr\u003e\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eASHOK K. SHARMA\u003c\/strong\u003e is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.\u003cbr\u003e\u003c\/p\u003e","brand":"Wiley-IEEE Press","offers":[{"title":"Hardcover","offer_id":42992854532211,"sku":"9.78078E+12","price":362.19,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0555\/9255\/0515\/files\/img_67ebae0b-62f6-49ea-a569-36f98530e8e8.jpg?v=1744719150","url":"https:\/\/bookstorenmore.com\/products\/semiconductor-memories-technology-testing-and-reliability-9780780310001","provider":"Bookstore N More","version":"1.0","type":"link"}