{"product_id":"statistical-methods-for-the-reliability-of-repairable-systems-9780471349419","title":"Statistical Methods for the Reliability of Repairable Systems","description":"A unique, practical guide for industry professionals who need to improve product quality and reliability in repairable systems\u003cbr\u003e \u003cbr\u003e Owing to its vital role in product quality, reliability has been intensely studied in recent decades. Most of this research, however, addresses systems that are nonrepairable and therefore discarded upon failure. Statistical Methods for the Reliability of Repairable Systems fills the gap in the field, focusing exclusively on an important yet long-neglected area of reliability. Written by two highly recognized members of the reliability and statistics community, this new work offers a unique, systematic treatment of probabilistic models used for repairable systems as well as the statistical methods for analyzing data generated from them.\u003cbr\u003e \u003cbr\u003e Liberally supplemented with examples as well as exercises boasting real data, the book clearly explains the difference between repairable and nonrepairable systems and helps readers develop an understanding of stochastic point processes. Data analysis methods are discussed for both single and multiple systems and include graphical methods, point estimation, interval estimation, hypothesis tests, goodness-of-fit tests, and reliability prediction. Complete with extensive graphs, tables, and references, Statistical Methods for the Reliability of Repairable Systems is an excellent working resource for industry professionals involved in producing reliable systems and a handy reference for practitioners and researchers in the field.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Asit P. Basu, Steven E. Rigdon\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley-Interscience\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 04\/14\/2000\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 290\u003cbr\u003e\u003cb\u003eBinding Type:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.40lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.52h x 6.48w x 1.02d\u003cbr\u003e\u003cb\u003eISBN:\u003c\/b\u003e 9780471349419\u003cbr\u003e\u003cbr\u003e\u003cb\u003eReview Citation(s): \u003c\/b\u003e\u003cbr\u003e\u003ci\u003eScitech Book News\u003c\/i\u003e 12\/01\/2000 pg. 128\u003cbr\u003e\u003cp\u003e\u003cb\u003eAbout the Author\u003c\/b\u003e\u003cbr\u003eSTEVEN E. RIGDON, PhD, is Professor of Statistics at Southern Illinois University Edwardsville. ASIT P. BASU, PhD, is Professor of Statistics at the University of Missouri Columbia.\u003cbr\u003e\u003c\/p\u003e\u003cp\u003e\u003ci\u003eThis title is not returnable\u003c\/i\u003e\u003cbr\u003e\u003c\/p\u003e","brand":"Wiley-Interscience","offers":[{"title":"Hardcover","offer_id":40356981014643,"sku":"9.78E+12","price":323.08,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0555\/9255\/0515\/products\/img_db8920ff-f1f2-4874-8a10-007a9a76683d.jpg?v=1660401512","url":"https:\/\/bookstorenmore.com\/products\/statistical-methods-for-the-reliability-of-repairable-systems-9780471349419","provider":"Bookstore N More","version":"1.0","type":"link"}