Applied Measurement with jMetrik

Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.

Author: J. Patrick Meyer
Publisher: Routledge
Published: 06/30/2014
Pages: 170
Binding Type: Paperback
Weight: 0.66lbs
Size: 9.00h x 6.00w x 0.60d
ISBN: 9780415531979

About the Author

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia