Electrical and Thermal Characterization of MESFETs, HEMTs and HBTs

This work provides a comprehensive discussion of the bias dependence of equivalent circuit parameters for the three devices and an extensive discussion of temperature dependence. It: covers recess-etched MESFETs and self-aligned MESFETs with and without lightly-doped-drains and JFETs; analyzes GaAs-based pHEMTS and InP lattice-matched HEMT equivalent circuits; and describes a large-signal, temperature-dependent model extractor for A1GaAs-GaAs HBTs. The book is intended for circuit designers, process and device developers and test engineers.

Author: Robert Anholt
Publisher: Artech House Publishers
Published: 11/30/1994
Pages: 324
Binding Type: Hardcover
Weight: 1.33lbs
Size: 9.33h x 6.30w x 0.87d
ISBN: 9780890067499

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