Fundamentals of Sum-Frequency Spectroscopy

The first book on the topic, and written by the founder of the technique, this comprehensive resource provides a detailed overview of sum-frequency spectroscopy, its fundamental principles, and the wide range of applications for surfaces, interfaces, and bulk. Beginning with an overview of the historical context, and introductions to the basic theory of nonlinear optics and surface sum-frequency generation, topics covered include discussion of different experimental arrangements adopted by researchers, notes on proper data analysis, an up-to-date survey commenting on the wide range of successful applications of the tool, and a valuable insight into current unsolved problems and potential areas to be explored in the future. With the addition of chapter appendices that offer the opportunity for more in-depth theoretical discussion, this is an essential resource that integrates all aspects of the subject and is ideal for anyone using, or interested in using, sum-frequency spectroscopy.

Author: Y. R. Shen
Publisher: Cambridge University Press
Published: 02/18/2016
Pages: 329
Binding Type: Hardcover
Weight: 2.28lbs
Size: 10.07h x 6.88w x 0.79d
ISBN: 9781107098848

Review Citation(s):
Choice 11/01/2016

About the Author
Shen, Y. R.: - Yeun-Ron Shen is responsible for the development of second harmonic and sum-frequency generation spectroscopy into viable tools for surface and interface studies. He has been on the faculty of the physics department of the University of California, Berkeley, since 1964 and has received many awards, including the Charles Hard Townes Award from the OSA, the Arthur L. Schawlow Prize and the Frank Isakson Prize from the APS, and the Max Planck Research Award. He is also a distinguished professor at Fudan University in Shanghai and an elected member of the US National Academy of Sciences, the American Academy of Arts and Sciences, the Chinese Academy of Sciences, and Academia Sinica.