(Ipf)Microelectronic Reliability

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

Author: Edward B. Hakim
Publisher: Artech House Publishers
Published: 01/31/1989
Pages: 396
Binding Type: Hardcover
Weight: 1.70lbs
Size: 9.37h x 6.34w x 1.17d
ISBN: 9780890062845

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