Microelectronic Test Structures for CMOS Technology

Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.

Author: Manjul Bhushan,Mark B. Ketchen
Publisher: Springer
Published: 10/01/2014
Pages: 373
Binding Type: Paperback
Weight: 1.25lbs
Size: 9.21h x 6.14w x 0.84d
ISBN: 9781489990556

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