Quantitative X-Ray Spectrometry

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.

Author: Ron Jenkins
Publisher: CRC Press
Published: 04/26/1995
Pages: 504
Binding Type: Hardcover
Weight: 1.69lbs
Size: 9.02h x 6.22w x 1.14d
ISBN: 9780824795542