Reliability and Degradation of III-V Optical Devices

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

Author: Osamu Ueda
Publisher: Artech House Publishers
Published: 09/30/1996
Pages: 372
Binding Type: Hardcover
Weight: 1.43lbs
Size: 9.30h x 6.31w x 0.95d
ISBN: 9780890066522

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