Scaling Effects on Metal-oxide-semiconductor Device Characteristics

Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Scaling Effects on Metal-oxide-semiconductor Device Characteristics" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.

Author: Steven Walstra
Publisher: Dissertation Discovery Company
Published: 05/31/2019
Pages: 152
Binding Type: Paperback
Weight: 0.81lbs
Size: 11.00h x 8.50w x 0.33d
ISBN: 9780530002323

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