Semiconductor Memories: Technology, Testing, and Reliability

Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

Author: Ashok K. Sharma
Publisher: Wiley-IEEE Press
Published: 09/10/2002
Pages: 480
Binding Type: Hardcover
Weight: 2.34lbs
Size: 10.27h x 7.29w x 1.17d
ISBN: 9780780310001

About the Author

ASHOK K. SHARMA is the author of Semiconductor Memories: Technology, Testing, and Reliability. He is currently working as a reliability engineering manager at NASA, Goddard Space Flight Center, Greenbelt, Maryland.