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Wiley-IEEE Press

Clustering

Clustering

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Format
This is the first book to take a truly comprehensive look at clustering. It begins with an introduction to cluster analysis and goes on to explore: proximity measures; hierarchical clustering; partition clustering; neural network-based clustering; kernel-based clustering; sequential data clustering; large-scale data clustering; data visualization and high-dimensional data clustering; and cluster validation. The authors assume no previous background in clustering and their generous inclusion of examples and references help make the subject matter comprehensible for readers of varying levels and backgrounds.

Author: Don Wunsch, Rui Xu
Publisher: Wiley-IEEE Press
Published: 10/24/2008
Pages: 368
Binding Type: Hardcover
Weight: 1.40lbs
Size: 9.30h x 6.40w x 0.90d
ISBN: 9780470276808

Review Citation(s):
Scitech Book News 03/01/2009 pg. 28

About the Author
Rui Xu, PhD, is a Research Associate in the Department of Electrical and Computer Engineering at Missouri University of Science and Technology. His research interests include computational intelligence, machine learning, data mining, neural networks, pattern classification, clustering, and bioinformatics. Dr. Xu is a member of the IEEE, the IEEE Computational Intelligence Society (CIS), and Sigma Xi.

Donald C. Wunsch II, PhD, is the M.K. Finley Missouri Distinguished Professor at Missouri University of Science and Technology. His key contributions are in adaptive resonance and reinforcement learning hardware and applications, neurofuzzy regression, improved Traveling Salesman Problem heuristics, clustering, and bioinformatics. He is an IEEE Fellow, the 2005 International Neural Networks Society (INNS) President, and Senior Fellow of the INNS.


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