Focused Beam Methods: Measuring Microwave Materials in Free Space

Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.

Author: John W. Schultz
Publisher: Createspace Independent Publishing Platform
Published: 10/15/2012
Pages: 142
Binding Type: Paperback
Weight: 0.63lbs
Size: 9.21h x 6.14w x 0.37d
ISBN: 9781480092853

About the Author
John Schultz received his B.S. Physics from the University of Maryland in 1987, his M.A. Physics from the University of Texas in 1990, and his Ph.D. Materials Engineering from the University of Dayton in 1997. He currently is a Research Engineer at the Compass Technology Group where he conducts research and development on the interaction of electromagnetic energy with complex materials and structures.

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