Foundations of Measurement Volume II: Geometrical, Threshold, and Probabilistic Representations Volume 2

All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.
Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures. Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations, and Volume III examines representation as expressed in axiomatization and invariance.

Author: David H. Krantz,R. Duncan Luce,Amos Tversky
Publisher: Dover Publications
Published: 12/15/2006
Pages: 512
Binding Type: Paperback
Weight: 1.13lbs
Size: 8.46h x 6.34w x 1.05d
ISBN: 9780486453156

Review Citation(s):
Scitech Book News 09/01/2007 pg. 40

About the Author
David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.

This title is not returnable