Modern RF and Microwave Measurement Techniques

This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analysers, real-time spectrum analysis, sampling oscilloscopes and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and dielectric measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail, and accompanied by state-of-the-art solutions to the unique technical challenges associated with its deployment. With each chapter delivered by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.

Author: Valeria Teppati
Publisher: Cambridge University Press
Published: 06/20/2013
Pages: 471
Binding Type: Hardcover
Weight: 2.30lbs
Size: 9.80h x 6.90w x 1.20d
ISBN: 9781107036413

About the Author
Teppati, Valeria: - Valeria Teppati is a Researcher in the Millimeter Wave Electronics Group of the Department of Information Technology and Electrical Engineering at ETH Zurich, developing innovative solutions to aspects of linear and non-linear measurement techniques.Ferrero, Andrea: - Andrea Ferrero is a Professor in the RF, Microwave and Computational Electronics group of the Department of Electronics and Telecommunications at Politecnico di Torino. He is a Distinguished Microwave Lecturer of the IEEE Microwave Theory and Techniques Society, and a Fellow of the IEEE.Sayed, Mohamed: - Mohamed Sayed is the Principal Consultant for Microwave and Millimeter Wave Solutions and has nearly 30 years' experience of developing microwave and millimetre wave systems for Hewlett-Packard Co. and Agilent Technologies Inc.