Neutron and X-ray Reflectometry: Emerging phenomena at heterostructure interfaces

This book introduces the techniques of neutron and x-ray reflectometry and presents the studies carried out to date, using the techniques to understand emerging phenomena at the interfaces of thin films.

Author: Saibal Basu, Surendra Singh
Publisher: Institute of Physics Publishing
Published: 12/27/2022
Pages: 200
Binding Type: Hardcover
Weight: 1.18lbs
Size: 10.00h x 7.00w x 0.44d
ISBN: 9780750346931

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