Skip to product information
1 of 1

Cambridge University Press

Nonlinear RF Circuits and Nonlinear Vector Network Analyzers

Nonlinear RF Circuits and Nonlinear Vector Network Analyzers

Regular price $135.99 USD
Regular price Sale price $135.99 USD
Sale Sold out
Shipping calculated at checkout.
Format
With increasingly low-cost and power-efficient RF electronics demanded by today's wireless communication systems, it is essential to keep up to speed with new developments. This book presents key advances in the field that you need to know about and emerging patterns in large-signal measurement techniques, modeling and nonlinear circuit design theory supported by practical examples.
Topics covered include:
- Novel large-signal measurement techniques that have become available with the introduction of nonlinear vector network analyzers (NVNA), such as the LSNA, PNA-X and SWAP
- Direct extraction of device models from large-signal RF dynamic loadlines
- Characterization of memory effects (self-heating, traps) with pulsed RF measurements
- Interactive design of power-efficient amplifiers (PA) and oscillators using ultra-fast multi-harmonic active load-pull
- Volterra and poly-harmonic distortion (X-parameters) behavioral modeling
- Oscillator phase noise theory
- Balancing, modeling and poly-harmonic linearization of broadband RFIC modulators
- Development of a frequency selective predistorter to linearize PAs

Author: Patrick Roblin
Publisher: Cambridge University Press
Published: 06/01/2011
Pages: 300
Binding Type: Hardcover
Weight: 1.65lbs
Size: 9.80h x 6.90w x 0.70d
ISBN: 9780521889957

About the Author
Roblin, Patrick: - Patrick Roblin is a Professor in the Department of Electrical and Computer Engineering at Ohio State University (OSU). He has worked at OSU since 1984, after receiving his D.Sc. degree in electrical engineering from Washington University. He is the founder of the Nonlinear RF Research Laboratory at OSU and previously co-wrote the book High-Speed Heterostructure Devices (Cambridge University Press, 2002).

View full details