Reliability and Availability Engineering: Modeling, Analysis, and Applications

Do you need to know what technique to use to evaluate the reliability of an engineered system? This self-contained guide provides comprehensive coverage of all the analytical and modeling techniques currently in use, from classical non-state and state space approaches, to newer and more advanced methods such as binary decision diagrams, dynamic fault trees, Bayesian belief networks, stochastic Petri nets, non-homogeneous Markov chains, semi-Markov processes, and phase type expansions. Readers will quickly understand the relative pros and cons of each technique, as well as how to combine different models together to address complex, real-world modeling scenarios. Numerous examples, case studies and problems provided throughout help readers put knowledge into practice, and a solutions manual and Powerpoint slides for instructors accompany the book online. This is the ideal self-study guide for students, researchers and practitioners in engineering and computer science.

Author: Kishor S. Trivedi, Andrea Bobbio
Publisher: Cambridge University Press
Published: 08/03/2017
Pages: 726
Binding Type: Hardcover
Weight: 3.43lbs
Size: 10.00h x 7.27w x 1.33d
ISBN: 9781107099500

About the Author
Trivedi, Kishor: - Kishor S. Trivedi is a Professor of Electrical and Computer Engineering at Duke University, North Carolina, and a Life Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and a recipient of the IEEE Computer Society's Technical Achievement Award.Trivedi, Kishor S.: - Kishor S. Trivedi is a Professor of Electrical and Computer Engineering at Duke University, North Carolina, and a Life Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and a recipient of the IEEE Computer Society's Technical Achievement Award.Bobbio, Andrea: - Andrea Bobbio is Professor of Computer Science in the Dipartimento di Scienze e Innovazione Tecnologica at the Università degli Studi del Piemonte Orientale, Italy, and a senior member of Institute of Electrical and Electronics Engineers (IEEE).