Yield and Reliability in Microwave Circuit and System Design

This reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.

Author: Michael D. Meehan
Publisher: Artech House Publishers
Published: 12/01/1993
Pages: 300
Binding Type: Hardcover
Weight: 1.29lbs
Size: 9.34h x 6.25w x 0.84d
ISBN: 9780890065273

This title is not returnable